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Monographs

  • Mokashalev S., Utke I., “Nanofabrication Using Focused Ion and Electron Beams: Principles & Applications”, Oxford University Press (to appear in Q4 / 2011), Chapter: “Gas Injection Systems”, V. Friedli, I. Utke, H.D. Wanzenboeck
  • Mokashalev S., Utke I., “Nanofabrication Using Focused Ion and Electron Beams: Principles & Applications”, Oxford University Press (to appear in Q4 / 2011), Chapter: “Deposition of Silicon Oxide”, H.D. Wanzenboeck
  • Bo Cui, “Lithography Vol. 1”, InTech Open Access Publishers (to appear in 2012),, “Focused Ion Beam Lithography”, H.D. Wanzenboeck and S. Waid

Peer - reviewed Journal Publications

  • M.M. Shawrav, P. Taus, H.D. Wanzenboeck, M. Schinnerl, M. Stoeger-Pollach, S. Schwarz, A. Steiger-Thirsfeld, E. Bertagnolli (2016). Highly conductive and pure gold nanostructures grown by electron beam induced deposition. Sci. Rep. 6, 34003 doi:10.1038/srep34003. Link
  • J. K.Mika, K. Schwarz, H.D. Wanzenboeck, P. Scholze and E. Bertagnolli. (2015), Investigation of neurotrophic factor concentrations with a novel in vitro concept for peripheral nerve regeneration. J. Neurosci. Res., 93: 1631–1640. Link
  • Direct-write Deposition and Focused-Electron-Beam-Induced Purification of Gold Nanostructures. D. Belic, M.M. Shawrav, . M. Gavagnin, M. Stöger-Pollach, H.D. Wanzenboeck, E. Bertagnolli (2015) ACS Appl. Mater. Interfaces 7 (4), pp 2467–2479 Link
  • Free-Standing Magnetic Nanopillars for 3D Nanomagnet Logic. M. Gavagnin, H.D. Wanzenboeck, S. Wachter, M.M. Shawrav, A. Persson, K. Gunnarsson, P. Svedlindh, M. Stöger-Pollach, E. Bertagnolli (2014). ACS Appl. Mater. Interfaces 6 (22), pp 20254-20260Link
  • Synthesis of Individually Tuned Nanomagnets for Nanomagnet Logic by Direct Write Focused Electron Beam Induced Deposition. M. Gavagnin, H.D.Wanzenboeck, D.Belic, E. Bertagnolli (2013). ACS Nano 7 (1), pp 777-784 Link
  • Shawrav, M. M., Belić, D., Gavagnin, M., Wachter, S., Schinnerl, M., Wanzenboeck, H. D. and Bertagnolli, E. (2014), Electron Beam-Induced CVD of Nanoalloys for Nanoelectronics. Chem. Vap. Deposition, 20: 251–257. doi: 10.1002/cvde.201407119. Link
  • Gavagnin, M., Wanzenboeck, H. D., Shawrav, M. M., Belic, D., Wachter, S., Waid, S., Stoeger–Pollach, M. and Bertagnolli, E. (2014), Focused Electron Beam-Induced CVD of Iron: a Practical Guide for Direct Writing. Chem. Vap. Deposition, 20: 243–250. doi: 10.1002/cvde.201407118. Link
  • Wachter, S., Gavagnin, M. Wanzenboeck, H.D., Shawrav, M.M., Belic, D., Bertagnolli, E., "Nitrogen as a carrier gas for regime control in focused electron beam induced deposition". Nanofabrication Vol. 1, Issue. 1. doi: 10.2478/nanofab-2014-0002. Link
  • Shawrav, M.M., Wanzenboeck, H.D., Belic, D., Gavagnin, M., Bethge, O., Schinnerl, M., Bertagnolli, E., "Mask-free prototyping of metal-oxide-semiconductor devices utilizing focused electron beam induced deposition", Phys. Status Solidi A. DOI: 10.1002/pssa.201330133 Link
  • Gavagnin, M., Wanzenboeck, H.D., Belic, D., Shawrav, M.M.,Persson, A., Gunnarsson,K.,Svedlindh, P., Bertagnolli, E., “Magnetic force microscopy study of shape engineered FEBID iron nanostructures”, Phys. Status Solidi A. doi: 10.1002/pssa.201330114 Link

  • Gavagnin, M., Wanzenboeck, H.D., Belic D., Bertagnolli, E., “Synthesis of Individually Tuned Nanomagnets for Nanomagnet Logic by Direct Write Focused Electron Beam Induced Deposition”, ACS Nano 7 (1), pp 777-784. Link
  • Waid, S., Wanzenboeck, H.D., Muehlberger, M., Bertagnolli, E. , “Optimization of 3D patterning by Ga implantation and reactive ion etching (RIE) for nanoimprint lithography (NIL) stamp fabrication” Microelectronic Engineering 97 , pp. 105-108 (2012)
  • Roediger, P., Wanzenboeck, H.D., Hochleitner, G., Bertagnolli, E., “Crystallinity-retaining removal of germanium by direct-write focused electron beam induced etching”         Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures 29 (4), art. no. 041801 (2011)
  • Roediger, P., Wanzenboeck, H.D., Waid, S., Hochleitner, G., Bertagnolli, E., “Focused-ion-beam-inflicted surface amorphization and gallium implantation-new insights and removal by focused-electron-beam-induced etching”, Nanotechnology 22 (23), art. no. 235302 (2011)
  • Ebm C, Hobler G, Waid S, Wanzenboeck HD, “Quantitative simulation of ion-beam induced deposition of nanostructures”, Journal of Vacuum Science and Technology B 29(1), 011031 (2011)
  • Hochleitner G, Steinmair M, Lugstein A,. Roediger P, Wanzenboeck HD, Bertagnolli E, “Focused electron beam induced deposition of gold catalyst templates for Si-nanowire synthesis”, Nanotechnology 22 (1) 015302 (2011)
  • Roediger P, Wanzenboeck HD, Hochleitner G, Bertagnolli E, Buehler W, “Focused electron beam induced etching of silicon by chlorine gas: Negative effects of residual gas contamination on the etching process”, Journal of Applied Physics 108(12) 124316 (2010)
  • Wanzenboeck HD, Roediger P, Hochleitner G, Bertagnolli E, Buehler W, “Novel method for cleaning a vacuum chamber from hydrocarbon contamination” Journal of Vacuum Science and Technology A 28(6), 1413-1420 (2010)
  • Ebm C, Hobler G, Waid S, Wanzenboeck HD, “Modeling of precursor coverage in ion-beam induced etching and verification with experiments using XeF2 on SiO2”, Journal of Vacuum Science and Technology B 28(5), 946-(2010)
  • Deutschinger A, Schmid U, Schneider M, Brenner W, Wanzenbock H, Volland B, Ivanov T, Rangelow IW, “Characterization of an electro-thermal micro gripper and tip sharpening using FIB technique”, Microsystems Technologiess – Micro- and Nanosystems Information Storage and Processing Systems 16(11), 1901-1908 (2010)
  • Roediger P, Hochleitner G, Bertagnolli E, Wanzenboeck HD, Buehler W, “Focused electron beam induced etching of silicon using chlorine”, Nanotechnology 21 (28), 285306 (2010)
  • Wanzenboeck HD, Waid S, Bertagnolli E, Muehlberger M, Bergmair I, Schoeftner R, “Nanoimprint lithography stamp modification utilizing focused ion beams” Journal of Vacuum Science and Technology B 27(6) 2679-2685 (2009)
  • Roediger P, Wanzenboeck HD, Hochleitner G, Bertagnolli E, “Evaluation of chamber contamination in a scanning electron microscope”, Journal of Vacuum Science and Technology B 27(6), 2711-2717 (2009)
  • Guell I, Wanzenboeck HD, Forouzan SS, Bertagnolli E, Bogner E, Gabor F, Wirth M , “Influence of structured wafer surfaces on the characteristics of Caco-2 cells”, Acta Biomaterialia 5(1) 288-297 (2009)
  • Wanzenboeck, H.D., Forouzan, S., Bertagnolli, E., Guell, I., Wirth, M., Gabor, F., “Topographic effects of microstructured biosensors”, ECS Transactions 16 (11), 209-215(2008)
  • Hochleitner G, Wanzenboeck HD, Bertagnolli E, “Electron beam induced deposition of iron nanostructures“, Journal of Vacuum Science and Technology B 26(3) 939944 (2008)
  • Wanzenboeck HD, Fischer M, Svagera R, Wernisch J, Bertagnolli E , “Custom design of optical-grade thin films of silicon oxide by direct-write electron-beam-induced deposition”, Journal of Vacuum Science and Technology B 24 (6) SI 2755-2760 (2006)
  • Fischer M, Wanzenboeck HD, Gottsbachner J, Muller S, Brezna W, Schramboeck M, Bertagnolli E, “Direct-write deposition with a focused electron beam”, 83(4-9) 784-787 (2006)
  • Wanzenboeck HD, Ostermaier C, Gruen A, Eichinger B, Karner M, Bertagnolli E., “Dot-array implantation for patterned doping of semiconductors”, Nuclear Instruments & Methods in Physics Research B (2006)
  • Brezna W, Fischer M, Wanzenboeck HD, , Bertagnolli E, Smoliner J, “Electron-beam deposited SiO2 investigated by scanning capacitance microscopy”, Applied Physics Letters 88(2), 122116 (2006)
  • Bogner E, Dominizi K, Hagl P, Bertagnolli E, Wirth M, Gabor F, Brezna W, Wanzenboeck HD, „Bridging the gap - Biocompatibility of microelectronic materials” Acta Biomaterialia 2(2) 229-237 (2006)
  • H.D. Wanzenboeck,; Fischer,-M.; Mueller,-S.; Bertagnolli,-E., “Custom-tailored microfluidic devices and nanoscaled actuators - on the fast track”, Proceedings-of-the-IEEE-Sensors-2004 (Eds.:  Rocha,-D.; Sarro,-P.-M.; Vellekoop,-M.-J.) (IEEE-Cat.-No.04CH37603), vol.1.2004: 227-8
  • H.-D., Wanzenboeck, Eichinger,-B.; Gruen,-A.; Karner,-M.; Dominizi,-K.; Hagl,-P.; Wissenwasser,-J.; Bertagnolli,-E., “Express pattern fabrication - single step processing by direct-write deposition”, Proceedings if the Material Research Society Symposium on Nontraditional Approaches to Patterning (Eds.:  Yang,-S.; Xia,-Y.; Liu,-J.; Lakeman,-C.-D.-E. ), Symposium-Proceedings-Vol.EXS-2.2004,  133-5
  • H.D. Wanzenboeck,- Almeder,-C.; Pacher,-C.; Bertagnolli,-E.; Bogner,-E.; Wirth,-M.; Gabor,-F. , “Cell growth on prestructured microelectronic semiconductor materials”, Proceedings if the Material Research Society Symposium on Architecture and Application of Biomaterials and Biomolecular Materials. (Eds.:  Wong,-J.-Y.; Plant,-A.-L.; Schmidt,-C.-E.; Shea,-L.; Coury,-A.-J.; Chen,-C.-S.; Barron,-A.-E.; Klok,-H.-A.; Deming,-T.-J.; Saltzman,-W.-M.; Chilkoti,-A.; Luo,-D.; Uhrich,-K.) Symposium-Proceedings-Vol.EXS-1. 2004: 369-75
  • M. Fischer, J. Gottsbachner, S. Müller, W. Brezna, H.D. Wanzenboeck, Direct-Write Deposition Utilising a Focused Electron Beam, GME Forum, Vienna, Austria; 17. - 18.03.2005; proceedings GME Forum 2005, 179-183W.Brezna, H.Wanzenböck, A.Lugstein, E.Bertagnolli, E.Gornik, J.Smoliner, Focussed Ion Beam Induced Damage in Silicon Studied by Scanning Capacitance Microscopy, Semicond. Sci. Technol. 18, 195 (2003)
  • S. Harasek, H.D. Wanzenboeck, E. Bertagnolli, “Compositional and electrical properties of zirconium dioxide thin films chemically deposited on silicon”, J. Vac. Sci. Technol. A 21, 653-658 (2003)
  • W.Brezna, H.Wanzenböck, A.Lugstein, E.Bertagnolli, E.Gornik, J.Smoliner, Focussed ion beam induced damage in silicon investigated with scanning capacitance microscopy, Physica E 19, 178, (2003)
  • S. Harasek, A. Lugstein, H.D. Wanzenboeck, E. Bertagnolli, “Slow Trap Response of Zirconium Dioxide Thin Film on Silicon”, Appl. Phys. Lett. 83, 1400-1402 (2003) H.D. Wanzenboeck, S. Harasek and E. Bertagnolli; " Local Nanodeposition of Dielectric Materials for Microelectronics", Proceedings of the 19th International VLSI Multilevel Interconnection Conference (02IMIC-400); (Library of Congress 89-644090), 2002
  • S. Harasek, H.D. Wanzenboeck, B. Basnar, J. Smoliner, J. Brenner, H. Stoeri, E. Gornik, and E. Bertagnolli; "MOCVD Growth and Nanoscale Characterization of Zirconium Oxide Thin Films", Thin Solid Films 414 (2002),199 –204
  • H. D.Wanzenboeck, E. Bertagnolli,J. Brenner, H. Störi; "Effects of Gas Phase Composition on Focused Ion Beam Induced Surface Deposition", Proceedings of the Electrochemical Society, ECS Spring 2001 Meeting, Washington D.C., Fundamental Gas-Phase and Surface Chemistry of Vapor Deposition II/Process Control, Diagnostics and Modeling in Semiconductor Manufacturing IV, p 392
  • H. D.Wanzenboeck, E. Bertagnolli, B. Basnar, J. Smoliner, M. Gritsch, H. Hutter, J. Brenner, C. Tomastik, H. Störi; "Surface and Interface Study of Ion Beam Deposited Silicon Oxide Thin Films", Proceedings of the Electrochemical Society, ECS Spring 2001 Meeting, Washington D.C., Silicon Nitride and Silicon Dioxide Thin Insulating Films (6th), p 44
  • H. D. Wanzenboeck, S. Gergov, U. Grabner, P. Pongratz, H. Stoeri, H. Hutter, B. Basnar, J. Smoliner, E. Bertagnolli; "Sublithographische Siliziumoxid-Strukturen für die Phasenshift-Technologie", Proceedings GME Forum 2001, 155 (ISBN: 3-901578-07-2)
  • H. D. Wanzenböck, E. Bertagnolli, U. Grabner, G. Hammer, P. Pongratz; "Structure investigation of FIB-prepared microchips using transmission electron microscopy (TEM)", Proc. ITE'2001, Informationstagung Mikroelektronik 2001, Vienna, ÖVE 26, p.325 (ISBN 3-85133-022-6)
  • H.D. Wanzenboeck, S.G. Gergov, W. Brezna, E. Bertagnolli; "Local Deposition of Silicon Oxide for phase shift photomasks", Proc. ITE'2001, Informationstagung Mikroelektronik2001, Vienna, ÖVE 26, p. 317 (ISBN 3-85133-022-6)
  • H. D. Wanzenboeck, A. Lugstein, H. Langfischer, S. Harasek, E. Bertagnolli; U. Grabner, P. Pongratz, B. Basnar, J. Smoliner, E. Gornik; "Effects of Ga-ion irradiation on chemical and electrical properties of materials processed by a Focused Ion Beam (FIB)", MRS Proceedings Volume 647, O6.6 (2001)
  • H. D. Wanzenboeck, S. Harasek, H. Langfischer, A. Lugstein, E. Bertagnolli, M. Gritsch, H. Hutter, C. Tomastik, J. Brenner, H. Stoeri "Local Deposition of Dielectrics for the deep sub-µm range", Proc.17th International VLSI Multilevel Interconnection Conference (VMIC),Sta Clara, CA, June 2000, pp.127-142.
  • H. Langfischer, E. Bertagnolli, A. Lugstein, H. D. Wanzenboeck, H. Hutter, M. Gritsch, C. Tomastik, "Improvement of FIB based Tungsten Metallization", Proc.17th International VLSI Multilevel Interconnection Conference (VMIC),Sta Clara, CA, June 2000, pp.439-441.
  • H.D. Wanzenboeck, A. Lugstein, H. Langfischer, E. Bertagnolli, M. Gritsch, H. Hutter, „Ion Beam Induced Deposition of Dielectric Nanostructures", 8th Int. Conference on Dielectric Materials, Measurement and Application (DMMA), Sept. 2000, Edinburgh, IEE Conference Publication No. 473 (ISBN 0 85296 730 6) pp. 485-490.
  • H. D. Wanzenboeck, S. Harasek, H. Langfischer, A. Lugstein, E. Bertagnolli, "Rapid Prototyping by Local Deposition of Siliconoxide and Tungsten Nanostructures for Interconnect Rewiring", 47th International Symposium of the American Vacuum Society, Boston, Oct. 2000, p.114.
  • H. D. Wanzenboeck, H. Langfischer, E. Bertagnolli, H. Stoeri, M. Gritsch, H. Hutter, "Material and Interface Characterisation of  Locally Deposited Dielectrics and Metals with a focused  Ion Beam (FIB)" 47th International Symposium of the American Vacuum Society Boston, Oct. 2000, p.227
  • H.D. Wanzenboeck, H. Langfischer, A. Lugstein, H. Senn, and  E. Bertagnolli, "Focused-Ion-Beam Modification in IC Prototyping" Mikroelektronik 1999 (Vienna), Proc. ME’99, ÖVE Schriftenreihe 23, (ISBN 3-85133-019-6), p 177-184.
  • H.D. Wanzenboeck, M. Verbeek, W. Maurer, E. Bertagnolli, „FIB Based Local Deposition of Dielectrics for Phaseshift Mask Modification", Proceedings of the SPIE (International Society for Optical Engineering), 20th Annual BACUS Symposium on Photomask Technology, Monterey, Sept. 2000, p.148 -157
  • H.D. Wanzenboeck, A. Lugstein, H. Langfischer, E. Bertagnolli, M. Gritsch, H. Hutter, „Ion Beam Induced Chemical Vapor Deposition of Dielectric Materials", Proceedings of the 2000 Material Research Society Spring-Meeting (MRS),  San Francisco, April 2000, p. 354.
  • A. Lugstein, H.D. Wanzenböck, E. Bertagnolli; "Focused Ion beam Technology - A new Approach for the Sub 100nm Microfabrication Regime"; Current developments of miroelectronics, Ed. K. Riedling, ISBN 3-901578-04-8, 175 (1999)
  • H.D. Wanzenboeck, H. Langfischer, A. Lugstein, H. Senn, E. Bertagnolli, „Focused-Ion-Beam Modification in IC Prototyping", Proceedings of the Mikroelektronik 1999 (Vienna) ME’99, ÖVE Schriftenreihe 23, ISBN 3-85133-019-6, (1999), p 177-184.
  • H.D. Wanzenböck, N. Weissenbacher, R. Kellner; "Surface enhanced infrared absorption (SEIRA) observed on different metal surface structures", AIP Conference Proceedings 430, p.598 (1998)
  • H.D. Wanzenböck, B. Mizaikoff, N. Weissenbacher, R. Kellner; "Surface enhanced infrared absorption spectroscopy (SEIRA) using external reflection on low-cost substrates", Fresen. J. Anal. Chem. 362(1), p.15 (1998)
  • N. Weissenbacher, B. Lendl, J. Frank, H. D. Wanzenböck, R. Kellner; "Surface enhanced Raman spectroscopy as a molecular specific detection system in aqueous flow-through systems", Analyst 123(5), 1057 (1998)
  • R. Kellner, B. Edl-Mizaikoff, M. Jakusch, H. D. Wanzenböck, N. Weissenbacher "Surface Enhanced Vibrational Spectroscopy - A New Tool in IR-Fiberoptic Chemical Sensing ?“, Appl. Spectrosc. 51 (4), 495 (1997)
  •   H. D. Wanzenböck, B. Edl-Mizaikoff, G. Friedbacher, M. Grasserbauer, R. Kellner, M. Arntzen, T. Luyven, W. Theiss and P. Grosse; "Surface-enhanced Infrared Absorption Spectroscopy (SEIRA) Using Multireflection ATR-elements“,  Mikrochim. Acta [Suppl.] 14, 665 (1997)
  • R. Kellner, H. D. Wanzenböck, N. Weissenbacher; "WPAC-Eurocurriculum Analytical Chemistry - Advanced Studies 1995", Fresenius J. Anal. Chem. 357(2), 197 (1996)
  • H. D. Wanzenböck, B. Mizaikoff, N. Weissenbacher and R. Kellner; "Multiple Reflection in Surface Enhanced Infrared Absorption Spectroscopy (SEIRA) and its Significance for Various Analyte Groups";  J. Molec. Struct. 410, 535 (1997)
  • N. Weissenbacher, B. Lendl, J. Frank, H. D. Wanzenböck, B. Mizaikoff, R. Kellner; "Continuous Surface Enhanced Raman Spectroscopy for the Detection of Trace Organic Pollutants in Aqueous Systems"; J. Molec. Struct. 410, 539 (1997)
  • G. Eder-Mirth, H. D. Wanzenböck, J. A. Lercher; "Zeolite induced chemical selectivity during toluene alkylation",  Stud. in Surf. Sci. Catal., 94, 449 (1995)

Recent Conferences (Talk/Poster)

Talks

  • H.D. Wanzenboeck, J. Mika, M.M. Shawrav, M. Gavagnin, B. Ismail, C. Zeiner,  A. Lugstein, E. Bertagnolli (2013). Direct ‐ write nano modification of semiconductor devices utilizing focused electron beam induced etching. 39th International Conference on Micro and Nano Engineering (Session: Focused Electron Beam Induced Processing), London, United Kingdom. 
  • M.M. Shawrav, H.D. Wanzenboeck, D. Belic, M. Gavagnin, O. Bethge, E. Bertagnolli (2013). 2D and 3D Noble Metal Nanostructures – FEBID Processing and Applications. E-MRS Spring Meeting (Symposium: N-III 2), Strasbourg, France. Link to the Abstract
  • M. Gavagnin, H.D. Wanzenboeck, D. Belic, M.M. Shawrav, M. Stoeger-Pollach, A. Steiger-Thirsfeld, E. Bertagnolli (2013). EBID-Modified AFM Tips for Magnetic Characterization of Magnetologic Devices. E-MRS Spring Meeting (Symposium: N- II 6), Strasbourg, France.  Link to the Abstract
  • D. Belic, H.D. Wanzenboeck, M.M. Shawrav, M. Gavagnin, E. Bertagnolli (2013). Electron beam curing effects in FEBID nanostructures of noble metals. E-MRS Spring Meeting (Symposium: N -II 4), Strasbourg, France.   Link to the Abstract   
  • M. Gavagnin, H.D. Wanzenboeck, D. Belic, M.M. Shawrav, E. Bertagnolli (2013). Electron beam induced deposition of iron-based nanowires for nanomagnet logic applications. 3rd Advanced Electron Microscopy Workshop, The Austrian Society for Electron Microscopy, Vienna, Austria.
  • M. Gavagnin, H.D. Wanzenboeck, E. Bertagnolli (2012). Electron beam induced deposition of Iron Nanomagnets as basic elements for Magnetic Sensors and NanoMagnet Logic Devices . 4th Focused Electron Beam Induced Processing Workshop. Zaragoza, Spain. Link to the Abstract
  • M. Gavagnin, H.D. Wanzenboeck, S. Waid, E. Bertagnolli (2012). Focused Electron Beam Induced Deposition as novel nanofabrication approach for magnetic nanosensors and nanomagnet logic. 56th International Conference on Electron, Ion and Phton Beam technology and Nanofabrication (EIPBN), Waikoloa, Hawaii, USA. Link to the Abstract

Posters

  • M. Gavagnin, H. D. Wanzenboeck, M.M. Shawrav, M. Stoeger-Pollach, M. Capriotti, E. Bertagnolli (2013). Electron Beam Induced Deposition of Fe-Co composites for Nanomagnet Logic technology. 39th International Conference on Micro and Nano Engineering (MNE) (Session: Focused Electron Beam Induced Processing), Imperial College, London, United Kingdom.
  • M. Gavagnin, H. D. Wanzenboeck, M.M. Shawrav, M. Stoeger-Pollach, M. Capriotti, E. Bertagnolli (2013). Low Momentum and High Aspect Ratio MFM Probes Fabricated by EBID. 39th International Conference on Micro and Nano Engineering (MNE) (Session: Focused Electron Beam Induced Processing), Imperial College, London, United Kingdom.
  • M.M. Shawrav, H.D. Wanzenboeck D. Belic, M. Gavagnin, O. Bethge, E. Bertagnolli (2013). Electron beam deposited noble metals for nanoelectronics applications. 39th International Conference on Micro and Nano Engineering (MNE) (Session: Focused Electron Beam Induced Processing), Imperial College, London, United Kingdom.
  • M.M. Shawrav, H. D. Wanzenboeck, D. Belic, M. Gavagnin, E. Bertagnolli (2013). Electron Beam Induced Curing of FEBID gold nanostructures. 39th International Conference on Micro and Nano Engineering (MNE) (Session: Focused Electron Beam Induced Processing), Imperial College, London, United Kingdom.
  • H.D. Wanzenboeck, M.M. Shawrav, D. Belic, M. Gavagnin, O. Bethge, E. Bertagnolli (2013). Investigation on Electronics Properties of Semiconductor Nanowires using Foucsed Electron Beam Induced Etching (FEBIE) with Chlorine. E-MRS Spring Meeting (Symposium:N-P1. 49), Strasbourg, France. Link to the Abstract
  • H.D. Wanzenboeck, J.K. Mika, M.M. Shawrav, M. Gavagnin, D. Belic, B. Ismail, A. Lugstein, C. Zeiner, E. Bertagnolli (2013). Nanoengineering of semiconductor nanowires by processing with a focused electron beam. E-MRS Spring Meeting (Symposium:N- P1. 56), Strasbourg, France. Link to the Abstract
  • M. Gavagnin, Heinz D. Wanzenboeck, D. Belic, M.M. Shawrav, E.Bertagnolli (2013). Magnetic Force Microscopy Study of Shape Engineered EBID Iron Nanostructures. E-MRS Spring Meeting (Symposium:N- P2. 16), Strasbourg, France. Link to the Abstract
  • M.M. Shawrav, D. Belic, M. Gavagnin, O. Bethge, H.D. Wanzenboeck, E. Bertagnolli  (2013). Electronic Applications of Focused Electron Beam Induced Deposited Noble Metals. GMe Forum, Society for Micro-and Nanoelectronics, Vienna University of Technology, Vienna, Austria. Link to the Abstract
  • M. Gavagnin, H.D.Wanzenboeck, K.Gunnarson, P.Svedlindh, E.Bertagnolli (2012). Magnetic Switching behaviour of high-purity iron nanowires deposited by FEBID. 4th Focused Electron Beam Induced Processing Workshop. Zaragoza, Spain. Link to the Abstract
  • M. Gavagnin, H.D. Wanzenboeck, S. Waid, E. Bertagnolli (2012). Magnetic reversal of iron nanowires deposited by Focused Electron Beam Induced Deposition for nanomagnet logic applications. 56th International Conference on Electron, Ion and Phton Beam technology and Nanofabrication (EIPBN), Waikoloa, Hawaii, USA. Link to the Abstract
  • H.D. Wanzenboeck, A. Amon, J.K. Mika, E. Bertagnolli (2012). Axon Isolation Device fabricated by Nanoimprint lithography. 56th International Conference on Electron, Ion and Phton Beam technology and Nanofabrication (EIPBN), Waikoloa, Hawaii, USA. Link to the Abstract
  • A. Amon, J.K. Mika, H.D. Wanzenboeck, E. Bertagnolli (2012). A novel platform for neural electrical activity measurements of neurites. International Congress BioNanoMed, Krems, Austria. 
  • S. Waid, J.K. Mika, S. Lindsey, H.D. Wanzenboeck, G. Hobler, E. Bertagnolli (2012). Fabrication of 3D Axon Isolation Channels by Inverse Modelling Assisted Focused Ion Beam Patterning. Micro- and Nano-Engineering (MNE). Toulouse, France.
  • H.D. Wanzenboeck, J.K. Mika, A. Amon, E. Bertagnolli, K. Schwarz, S. Huck (2011). Microelectronic measurement platform for neural activity. Annual Meeting of the Austrian Neuroscience Association, Alpbach, Austria. 

Lectures

  • H.D. Wanzenboeck, M. Gavagnin, D. Belic, M.M. Shawrav, E.Bertagnolli (2013). Focused Electron Bean Induced Processing. Graz University of Technology, Graz, Austria.
  • H.D. Wanzenboeck, L. Schneider, J.K. Mika (2011). Custom-engineered Microelectrode Array for electrical investigation of neuronal cell cultures. Center for Brain Research, University of Vienna, Austria. 

Published Patents of Heinz Wanzenboeck

  • EP2276051 (A2) – “Particle beam microscopy system and method for operating the same”, Buehler Wolfram, Doemer Holger; Lang Matthias; Stodolka Joerg; Roediger Peter; Bertagnolli Emmerich; Wanzenboeck Heinz, (Anmelder Carl Zeiss NTS GmbH) (2011)
  • DE102009033319 (A1), “Partikelstrahl-Mikroskopiesystem und Verfahren zum Betreiben desselben” (2011); Buehler Wolfram, Doemer Holger; Lang Matthias; Stodolka Joerg; Roediger Peter; Bertagnolli Emmerich; Wanzenboeck Heinz, (Anmelder Carl Zeiss NTS GmbH)
  • CN101964294 (A) - “Particle beam microscopy system and method for operating the same”, Buehler Wolfram, Doemer Holger; Lang Matthias; Stodolka Joerg; Roediger Peter; Bertagnolli Emmerich; Wanzenboeck Heinz, (Anmelder Carl Zeiss NTS GmbH) (2011)
  • US2010276607 (A1) - “Method of depositing protective structures”, Wanzenboeck Heinz, Buehler Wolfram, Doemer Holger; Kuebler Carl, Fischer Daniel, Hochleitner Gottfried; Bertagnolli Emmerich; (Anmelder Carl Zeiss NTS GmbH) (2010)
  • EP 2275797 (A1) - “Method of depositing protective structures”, Wanzenboeck Heinz, Buehler Wolfram, Doemer Holger; Kuebler Carl, Fischer Daniel, Hochleitner Gottfried; Bertagnolli Emmerich; (Anmelder Carl Zeiss NTS GmbH) (2010)
  • DE 102009008166 (A1) - “Verfahren zur Abscheidung von Schutzstrukturen”, Wanzenboeck Heinz, Buehler Wolfram, Doemer Holger; Kuebler Carl, Fischer Daniel, Hochleitner Gottfried, Bertagnolli Emmerich; (Anmelder Carl Zeiss NTS GmbH) (2010)
  • EP2091066 (A2) – “Processing system”, Bertagnolli Emmerich, Wanzenboeck Heinz, Buehler Wolfram, Stebler Camille; Zeile Ulrike, Rosenthal Alexander; (Anmelder Carl Zeiss NTS GmbH) (2010)
  • US 20100024730 (A1) – “Processing system”, Bertagnolli Emmerich, Wanzenboeck Heinz, Buehler Wolfram, Stebler Camille; Zeile Ulrike, Rosenthal Alexander; (Anmelder Carl Zeiss NTS GmbH) (2010)
  • DE 102008009640 – “Prozessierungssystem”, Bertagnolli Emmerich, Wanzenboeck Heinz, Buehler Wolfram, Stebler Camille; Zeile Ulrike, Rosenthal Alexander; (Anmelder Carl Zeiss NTS GmbH) (2010)
  • JP2009187928 - “System for processing Object” - Buehler Wolfram, Rosenthal Alexander, Stebler Camille, Bertagnolli Emmerich, Wanzenboeck Heinz, (Anmelder Carl Zeiss NTS GmbH) (2009)
  • EP2061068 (A1) - “System for processing an Object” - Buehler Wolfram, Rosenthal Alexander, Stebler Camille, Bertagnolli Emmerich, Wanzenboeck Heinz, (Anmelder Carl Zeiss NTS GmbH) (2009)
  • US2009152460 - “System for processing an Object” - Buehler Wolfram, Rosenthal Alexander, Stebler Camille, Bertagnolli Emmerich, Wanzenbock Heinz, (Anmelder Carl Zeiss NTS GmbH) (2009)
  • DE102007054074 - “System zum Bearbeiten eines Objekts” - Buehler Wolfram, Rosenthal Alexander, Stebler Camille, Bertagnolli Emmerich, Wanzenboeck Heinz, (Anmelder Carl Zeiss NTS GmbH) (2009)
  • JP2009187928 - “System and Method of Processing Object” - Buehler Wolfram, Rosenthal Alexander, Bertagnolli Emmerich, Wanzenboeck Heinz, Fischer Markus, Hochleitner Gottfried, (Anmelder Carl Zeiss NTS GmbH) (2009)
  • EP2061066 (A3) “System and Method of Processing an Object with a Charged Particle Beam” - Buehler Wolfram, Rosenthal Alexander, Bertagnolli Emmerich, Wanzenboeck Heinz, Fischer Markus, Hochleitner Gottfried, (Anmelder Carl Zeiss NTS GmbH) (2011)
  • US20090152459 (A1) - “System and Method of Processing an Object” - Buehler Wolfram, Rosenthal Alexander, Bertagnolli Emmerich, Wanzenbock Heinz, Fischer Markus, Hochleitner Gottfried, (Anmelder Carl Zeiss NTS GmbH) (2009)
  • DE102007054073 (A1) – “System und Verfahren zum Bearbeiten eines Objekts”- Wanzenboeck Heinz, Bertagnolli Emmerich, Fischer Markus, Hochleitner Gottfried Buehler Wolfram, Rosenthal Alexander,, (Anmelder Carl Zeiss NTS GmbH) (2009)
  • DE102008049655 (A1) – “Particle beam system e.g. transmission electron microscope, in semiconductor industry, has source and particle beam formation elements formed for producing electron beam and arranged together with gas supply system in inner chamber“ - Rosenthal Alexander, Buehler Wolfram, Doemer Holger, Stebler Camille, Bertagnolli Emmerich, Wanzenboeck Heinz, (Anmelder Carl Zeiss NTS GmbH) (2010)